臺灣博碩士論文加值系統

本論文分別使用相位差法、共振法與不連續線段的方法量測板材介電係數與損耗正切值。量測板材的介電係數部分：相位差法是使用兩條不同長度的傳輸線，並量測兩段線之間相位差，再透過公式反推有效介電係數；共振法則是使用不同長度的微帶線並設計共振腔，透過量測出的共振頻率，再利用公式反推有效介電係數；不連續線段的方法是使用一條具有兩個不連續線段法的微帶線與另一條用自校準原理的等線寬微帶線，將量測結果透過矩陣跡值的方式求解有效介電係數。
計算損耗正切值前需要先求得介質損耗，然而介質損耗則是與導體損耗以及電路總損耗有關並透過公式推導介質損耗，量測板材的總損耗可分為三種方法：透過量測出的散射參數與功率損耗公式推導總損耗，另一個是透過品質因數與插入損耗的關係式推導在共振頻率下的總損耗，最後則是透過自校準原理與矩陣跡值的方式求解總損耗，之後利用理論分析求解導體損耗與介質損耗，再透過公式反推損耗正切值。
因為饋入線在相位差法與不連續線段的方法中會帶來影響，因此本論文還利用Thru-Reflect-Line的校正方式與使用夾具進行量測，可以解決饋入線所產生的誤差並將其扣除，可以得到更精確的測量結果，藉由相位差法、共振法與不連續線段的方法透過量測進行比較，探討是否可以使用不連續段的方法進行板材參數量測。

This paper presents the measurement of the dielectric constants and loss tangent of a substrate using three different methods: phase difference method, resonance method, and discontinuous microstrip lines. For the measurement of the dielectric constants of the substrate, the phase difference method involves using two transmission lines of different lengths and measuring the phase difference between them. The effective dielectric constants is then calculated using a formula. The resonance method uses microstrip lines of varying lengths and designs resonant cavities. By measuring the resonant frequencies and utilizing a formula, the effective dielectric constants can be determined. The discontinuous microstrip lines employs a microstrip line with two discontinuous sections and another microstrip line with a self-calibrated equal line width. The effective dielectric constants is obtained by solving the measurement results through matrix trace calculation.
Before calculating the loss tangent, the dielectric loss need to be determined. However, the dielectric loss is closely related to the total loss and conductor loss. The total loss of the substrate can be derived using three methods: calculating the total loss through the scattering parameters and power loss formula, deriving the total loss at resonance frequencies through the relationship between quality factor and insertion loss, or solving the total loss using self-calibration and matrix trace calculation.
The conductor loss and dielectric loss are then computed theoretically, and the loss tangent is obtained by inverse calculation using a formula.
Since the feed line can introduce errors in the phase difference method and the discontinuous microstrip lines, this paper also applies the Thru-Reflect-Line calibration method and utilizes fixtures for measurements. These approaches help mitigate the errors caused by the feed line and provide more accurate measurement results. By comparing the results obtained from the phase difference method, resonance method, and discontinuous microstrip lines, this study aims to investigate whether the discontinuous microstrip lines can be used for substrate parameter measurement.

第一章 緒論
1.1 研究背景
1.2 文獻探討
1.2.1 計算矩陣跡值並以反矩陣的方式進行自校準原理
1.2.2 不連續線段法計算介電係數
1.2.3 Thru-Reflect-Line校正方式
1.3 研究動機
1.4 論文架構
第二章 介電係數與損耗正切值理論分析
2.1 介電係數
2.2 有效介電係數
第三章 利用三種方法計算介電係數
3.1 利用三種方法計算有效介電係數
3.1.1 以相位差法計算有效介電係數
3.1.2 以共振法計算有效介電係數
3.1.3 以不連續線段法計算有效介電係數
3.2 利用三種方法的有效介電係數轉換成介電係數
第四章 利用三種方法計算損耗正切值
4.1 板材的介質損耗與電路總損耗
4.1.1 以相位差法計算總損耗
4.1.2 以共振法計算總損耗
4.1.3 以不連續線段法計算總損耗
4.2 利用理論公式計算三種方法的導體損耗
4.3 利用三種方法的介質損耗計算損耗正切值
第五章 實作電路設計流程與量測結果
5.1 貫穿-反射-傳輸線(Thru-Reflect-Line)
5.1.1 貫穿（Thru）
5.1.2 反射（Reflect）
5.1.3 傳輸線（Line）
5.2 設計流程
5.3 量測儀器架設
5.4 量測結果
5.4.1 M2~M4經過 Thru-Reflect-Line校正方式後的結果
5.4.2 M2和M3的相位差與M5~M8的共振頻率
5.4.3 利用三種方法計算的有效介電係數之疊圖比較
5.4.4 利用三種方法計算的介電係數之疊圖比較
5.4.5 利用三種方法計算的總損耗之疊圖比較
5.4.6 利用三種方法計算的導體損耗之疊圖比較
5.4.7 利用三種方法計算的介質損耗之疊圖比較
5.4.8 利用三種方法計算的損耗正切值之疊圖比較
第六章 結論與未來展望
6.1 結論
6.2 未來展望
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