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This study aims to explore the design and implementation of Overall Equipment Effectiveness (OEE) for semiconductor testing equipment in order to improve equipment utilization, production efficiency, and reduce production costs.While many scholars have studied OEE in semiconductor testing equipment in the past, this study focuses on the integration and standardization of the entire OEE system, including the design and implementation of Calculation, Collection, and Application. A systematic approach was used in this study for the design and implementation of OEE, which includes defining basic data items, correlation and construction, automatic data collection methods, data calculation methods, data analysis and reporting, setting improvement goals, executing improvement actions, performance management mechanisms, and continuous improvement operations, with the PDCA methodology incorporated throughout. This study provides a useful reference and guidance for semiconductor testing plants to improve their equipment's overall efficiency, OEE, and competitiveness
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