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參考文獻 英文文獻: [1]SEMATECH, “Overall Equipment Efficiency Guidebook Revision 1,” SEMATECH Technical Reports, 1995. [2]Richard Hedman, Mukund Subramaniyan and Peter Almstrom, “Analysis of critical factors for automatic measurement of OEE,” 49th CIRP Conference on Manufacturing Systems, pp.128-133, 2016. [3]Yogi Tri Prasetyo and Felix Concepcion Veroya, “An Application of Overall Equipment Effectiveness (OEE) for Minimizing the Bottleneck Process in Semiconductor Industry,” 2020 IEEE 7th International Conference on Industrial Engineering and Applications, 2020. [4]Jose Arturo Garza-Reyes, “From measuring overall equipment effectiveness (OEE) to overall resource effectiveness (ORE),” Journal of Quality in Maintenance Engineering, pp.506-527, 2015. [5]Miguel Saez, Francisco Maturana, Kira Barton and Dawn Tilbury, “Real-time Manufacturing Machine and System Performance Monitoring Using Internet of Things,” IEEE Transactions on Automation Science and Engineering, 2018. [6]Klint Allen A. Mariñas, Yung-Tsan Jou and Riana Magdalena Silitonga, “Investigating the Overall Equipment Effectiveness (OEE) of Die Casting Injection Machines using Productivity Analysis,” Second Asia Pacific International Conference on Industrial Engineering and Operations Management, pp.2312-2320, 2021. [7]Okpala Charles Chikwendu, Anozie Stephen Chima and Mgbemena Chika Edith, “The optimization of overall equipment effectiveness factors in a pharmaceutical company,” Journal of Heliyon, 2020. [8]Vandana Sonwaney and Rohit Kumar Singh, “Measurement of overall equipment effectiveness to improve operational efficiency,” International Journal of Process Management and Benchmarking, pp.246-261, 2018. [9]Chetan Patel and Vivek A Deshpande, “A Review on Improvement in Overall Equipment Effectiveness,” International Journal for Research in Applied Science & Engineering Technology, pp.642-650, 2016. [10]M.A. Chik, M.S.A. Abd Malik and M.D.Y. Faizah, “Capacity Improvement for 200mm PVD Cluster Equipment CMOS Technology,” 2020 4th IEEE Electron Devices Technology & Manufacturing Conference, 2020. [11]R.W. Freck, “Using overall equipment effectiveness (OEE) and the equipment improvement process (ET) to improve Fab throughput,” 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, 2000. [12]Xiaoyan Li, Guangfu Liu and Xinyu Hao, “Research on Improved OEE Measurement Method Based on the Multiproduct Production System,” Journal of Applied Sciences, 2021. [13]SEMI, “Standard for Definition and Management of Equipment Reliability, Availability, and Maintainability,” SEMI E10, 1996.
中文文獻: [14]凌國榮 編著,「設備綜合效率改善之研究」,淡江大學高階主管管理碩士學程碩士論文,2002。 [15]日本設備維護協會 編著,財團法人中衛發展中心 翻譯,「新TPM加工組立」,財團法人中衛發展中心,2016。 [16]陳文哲 編著,「現場管理與改善」,中興管理顧問公司,pp.99-102,2002。 [17]鍾明鴻 編著,「設備管理」,超越企管工商叢書,pp.136-141,1997。 [18]劉承元 編著,「TPM與工廠全面改善」,廣東經濟出版社,2006。 [19]大野耐一 編著,國瑞協力會TPS自主研究會 翻譯,「豐田生產方式」,財團法人中衛發展中心,2005。 [20]中衛中心功能技術部 編著,「躍向全球的全面生產管理之路-TPM的台灣經驗」,財團法人中衛發展中心,2010。
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