臺灣博碩士論文加值系統

本研究主要應用SOPC(System-on-a-programmable-chip)技術發展影像循邊量測系統，在影像循邊量測系統的晶片內，包含硬體及軟體兩大部分。
硬體部分包含：(1)影像擷取電路：擷取CMOS(Complementary metal-oxide-semiconductor)影像感測器之訊號。(2)規劃Nios II微處理器：作為影像循邊量測程序運行的平台。
軟體部分(Nios II 微處理器)包含：(1)I2C(Inter-integrated circuit)串列通訊介面：利用Nios II的PIO(Parallel input/output)完成寫入CMOS影像感測器的暫存器之功能。(2)影像循邊處理演算法：搭配所設計的影像擷取硬體電路，對所擷取的影像資料進行處理，其流程為：影像還原、灰階化、低通濾波、Otsu門檻值決定法、二值化、Laplacian operator 測邊、細化、去毛邊、八連通循邊及次像素定位。(3)待測物件參數演算法：利用所循得的邊點資訊，來求得該物件之相關參數，待測物件包含：圓、橢圓、平行四邊形及三角形物件，而對於其他物件可求得其最小外接矩形參數。
在系統晶片內之硬體部分使用Verilog 硬體描述語言撰寫；軟體部分使用C 程式語言撰寫，系統晶片採用美商ALTERA 公司生產的Stratix II EP2S60F672C3N FPGA(Field-programmable gate array)，CMOS影像感測器採用國內PIXART公司所生產的PAS6311LT彩色影像感測器，此感測器為解析度為648×488，最後，本論文整合一套系統，包括Nios II 發展板、三軸平行機構和CMOS影像感測器等，經由實驗結果之比較來驗證本文所設計的系統晶片之有效性與正確性。

An edge tracing measurement integrated circuit (IC) using System-on-a-programmable-chip (SOPC) technology is presented in this thesis. In the proposed measurement IC, there are two modules. One module is implemented by hardware circuit, which functions are Complementary metal-oxide-semiconductor (CMOS) image sensor signal capture and scheme Nios II microprocessor. The other module is implemented by software using Nios II microprocessor, which functions are writing registers of CMOS image sensor using Inter-integrated circuit (I2C) and the edge tracing measurement algorithm, such as Otsu’s method, Laplacian operator, thinning, chain code, subpixel theorem and so on. The digital hardware circuits are designed by Verilog language and programed in Nios II microprocessor coded in C language. The Field-programmable gate array (FPGA) chip adopts ALTERA Stratix II EP2S60F672C3N on the development board. The CMOS color image sensor adopts PIXART PAS6311LT which resolution is 648×488 pixels. At last, an integrated experimental system that includes Nios II development board, three degree of freedom parallel mechanism and CMOS image sensor is implemented. The experimental results verify the feasibility and correctness of the proposed measurement system.

摘要 I
Abstract II
誌謝 III
目錄 IV
圖目錄 VI
表目錄 IX
第一章 緒論 1
1.1 前言 1
1.2 文獻回顧 2
1.2.1影像處理之回顧 2
1.2.2 系統晶片(SOPC)應用於影像處理之回顧 4
1.3 研究動機與目的 4
1.4 論文架構 5
第二章 影像循邊量測系統架構 6
2.1 FPGA發展板 7
2.2 CMOS影像感測器 11
2.3 光源設備 14
2.4 三軸平行機構 14
2.5 個人電腦 15
第三章 可程式系統晶片之設計 16
3.1 I2C串列同步傳輸電路 18
3.2 CMOS Sensor影像訊號擷取 21
3.3 Nios II 微處理器規劃 24
第四章 循邊量測影像處理技術 30
4.1 色彩內插演算法 31
4.2 影像灰階化 34
4.3 影像低通濾波 35
4.4 統計式門檻值決定法 37
4.5 影像二值化 41
4.6 影像測邊 42
4.6.1 Sobel Operator(一階導數) 44
4.6.2 Laplacian Operator(二階導數) 46
4.7 影像細化 48
4.8 去毛邊 51
4.9 軌跡追蹤 53
4.10 次像素法則 58
4.11 量測物件參數求法 62
4.11.1 圓或橢圓物件 62
4.11.2 平行四邊形物件 65
4.11.3 三角形物件 68
第五章 實驗結果與討論 69
5.1 循邊影像處理演算法之實驗 69
5.2 待測物件參數演算法之實驗 72
5.3 量測結果 76
5.4 實驗結果之討論 86
第六章 結論與未來展望 87
6.1 結論 87
6.2 未來展望 87
參考文獻 89
附錄一 I2C程式碼 92
附錄二 影像擷取電路程式碼 95
作者簡介 97

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